Direct Selection
Individual components for Prisma 80 and QMG 200
Analyzers QMA 200F/M
Individual components for QMG 422
Prisma Quadrupol-Analyzer, with Faraday
Quadrupol electronics QME 80, QME 200 F/M
QMA 200 F, PrismaTM Quadrupol-Analyzer, with iridium yttriated filament
QMA 200 F , PrismaTM Quadrupol-Analyzer with tungsten filament
Prisma Quadrupol-Analyzer, with C-SEM
QMA analysators 125 / 400 / 410 / 430
Individual components for SPM 200, SPM 400
Individual components for Gas Inlet Systems
QMA 125 analysator with 90 Grad-SEV / Faraday
752
QMA 125, Analyzer with 90º-SEM/Faraday gas tight Cross-Beam ion source, 2 tungsten filaments
QMA 125, Analyzer with 90º-SEM/Faraday axial ion source, rhenium filament
QMA 125, Analyzer with 90º-SEM/Faraday Cross-Beam ion source, 2 tungsten filaments
QMA 125, Analyzer with 90º-SEM/Faraday grid ion source, tungsten filament
QMA 125, Analyzer with 90º-SEM/Faraday vacuum annealed, grid ion source, tungsten filament
QMA 400 analysator with 90 Grad-SEV / Faraday
QMA 400, Analyzer with 90º-SEM/Faraday axial ion source, 1 rhenium filament
QMA 400, Analyzer with 90º-SEM/Faraday Cross-Beam ion source, 2 tungsten filaments
QMA 400, Analyzer with 90º-SEM/Faraday gas tight Cross-Beam ion source, 2 tungsten filaments
QMA 400, Analyzer with 90º-SEM/Faraday Grid ion source, 1 tungsten filament
QMA 400, Analyzer with 90º-SEM/Faraday, ion optics, 3 lenses
QMA 400, Analyzer with 90º-SEM/Faraday Cross-Beam ion source with magnet, 2 tungsten filaments
759
QMA 410, Analyzer with 90º-SEM/Faraday Cross-Beam ion source with magnet, 2 tungsten filaments
QMA 410, Analyzer with 90º-SEM/Faraday gas tight Cross-Beam ion source, 2 tungsten filaments
760
QMA 430, Analyzer with 90º-SEM/Faraday axial ion source, 1 rhenium filament
QMA 430, Analyzer with 90º-SEM/Faraday Cross-Beam ion source, 2 tungsten filaments
QMA 430, Analyzer with 90º-SEM/Faraday gas tight Cross-Beam ion source, 2 tungsten filaments
QMA 430, Analyzer with 90º-SEM/Faraday grid ion source, 1 tungsten filament
761
HV 421, High voltage supply
IS 420, Ion source supply
High voltage cable HV/SEM, 3 m
High voltage cable HV/SEM, 10 m
HV 420, high voltage supply
IS 420 / QMA, Ion source supply, cable 3 m
IS 420 / QMA, Ion source supply, cable 10 m
QMS 422, Quadrupole controller, 14 slots
762
Cable QMS, QMI-QME, 20 m
Cable QMS, QMI-QME, 10 m
QME holder, DN 63 CF
QME 125 - 1, Quadrupole Electronics, 2,45 MHz, 1 - 100 amu
QME 125 - 2, Quadrupole Electronics, 2 MHz, 1 - 200 amu
QME 125 - 1, Quadrupole Electronics, 2 MHz, 1 - 100 amu
763
Extension cable QMH - QMS, length 7 m
QMH 400-5, RF generator, 2,26 MHz
QMH 400-1, RF generator, 2.05 MHz
QMH 410-1, RF generator, 1,7 MHz
QMH 410-2, RF generator, 1,3 MHz
QMH 410-3, RF generator, 1,4 MHz
764
SEM 218, Secondary electron multiplier, with conversion dynode, 18 CU-Be-dynodes, 400 °C, max.
HC-SEM 218, Secondary electron multiplier, mounted at flange, for conversion SEM 217 to SEM 218
SEM 217, Secondary electron multiplier, 17 CU-Be-dynodes, 400 °C, max.
765
For pressure range up to 10 mbar
Quadstar Software
HPI 010 - Valve interface
For pressure range up to 1 mbar
HPI 010, Valve interface, manually actuated
HPI 010, valve interface, electropneumatically actuated, 24 V DC
Double gate valve
Gas Inlet System for Inert Gases
Gas Inlet System for Trace Analysis
Gas connection
Vacuum Chambers, LN2-Cold Trapp
Chamber, for QMA 400, QMA 430 and QMA 125 with SEM
Heater, for HPA chamber
Chamber, for QMA 410 with Cross-Beam ion source
LN2-Cold trapp, DN 63 CF
Chamber, for QMA 200 F, QMA 200 M and QMA 125 with Faraday
Sensor cable PKR-QME, 0.6 m
Orifices
[ Accessories ]
IS 420
For installation in the controller QMS 422. 5 slots of QMA are needed. Supplies power to the ion source and ion optics.
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- Rotary Vane Pumps
- Roots pumps
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- Dry pumps
- Flange components
- Feedthroughs and lubricants
- Valves
- Leak detectors
- Measurement instruments
- Vacuum analysis
- Residual gas analysis in high vacuum
- Residual gas analysis in ultra high vacuum
- Gas analysis in the pressure range of < 10-4 mbar
- Gas analysis in the pressure range of up to 10 mbar
- Gas analysis in the pressure range of up to 1 bar
- Ion analysis and plasma monitoring
- Individual components
- Mass spectrometer accessories
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