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Prisma QMS 200 M with C-SEM
Prisma QMS 200 M1, 1-100 amu
open ion source gas tight ion source Cross-Beam ion source
Prisma QMS 200 M2, 1-200 amu
open ion source gas tight ion source Cross-Beam Ionenquelle
Prisma QMS 200 M3, 1-300 amu
open ion source gas tight ion source Cross-Beam Ionenquelle
QMG 422 with QMA 125 PrismaPlusTM QMG 220 M with C-SEM-detector
PrismaPlusTM QMG 220 M1, 1-100 amu
PrismaPlusTM QMG 220 M1 with open ion source PrismaPlusTM QMG 220 M1 with gas-tight ion source PrismaPlusTM QMG 220 M1 with grid ion source PrismaPlusTM QMG 220 M1 with crossbeam ion source
PrismaPlusTM QMG 220 M2, 1-200 amu
PrismaPlusTM QMG 220 M2 with open ion source PrismaPlusTM QMG 220 M2 with gas-tight ion source PrismaPlusTM QMG 220 M2 with grid ion source PrismaPlusTM QMG 220 M2 with crossbeam ion source
PrismaPlusTM QMG 220 M3, 1-300 amu

Residual gas analysis in ultra high vacuum

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The employment of a secondary electron multiplier (SEM) is meaningful for qualitative analysis in the pressure range between 10-10 mbar und 10-7. This extremely sensitive preamplifier enables even minute concentrations to be detected at fast measuring speeds.

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